
BOOKS - TECHNICAL SCIENCES - Defects in Advanced Electronic Materials and Novel Low D...

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
Author: Edited by Jan Stehr, Irina Buyanova, Weimin Chen
Year: 2018
Pages: 309
Format: PDF
File size: 10,9 MB
Language: ENG

Year: 2018
Pages: 309
Format: PDF
File size: 10,9 MB
Language: ENG

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